Eventos Anais de eventos
COBEM 2017
24th ABCM International Congress of Mechanical Engineering
A Strip-Yield Algorithm to Predict Fatigue Crack Closure and Growth
Submission Author:
Samuel Elias Ferreira , RJ
Co-Authors:
Jaime T P Castro, Marco Antonio Meggiolaro, Samuel Elias Ferreira
Presenter: Samuel Elias Ferreira
doi://10.26678/ABCM.COBEM2017.COB17-2239
Abstract
Strip-yield models, which assume that the effective stress intensity range (Keff) is the driving force for fatigue crack propagation, are widely used for fatigue design purposes. Since originally proposed by Newman in 1981, a few strip-yield algorithms have been developed and implemented in commercial or proprietary codes, to calculate fatigue crack opening stresses created by plasticity-induced crack closure. Since such codes are not properly discussed in the open literature, here an academic strip-yield algorithm especially developed to calculate DKeff under constant and variable amplitude loading is described in detail. Like in similar commercial codes, this homemade algorithm uses equations for plastic zones, element displacements, and opening stresses proposed by Newman, and combine them with a proper calculation procedure. Moreover, its capability to reproduce measured opening loads and fatigue crack growth rates is also analyzed.
Keywords
strip-yield model, crack-opening stress, variable amplitude load
